Patent · US Expired

Device for measuring a bending load

US6384404B1 · kind B1 · utility

15Cited by
2References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 5, 2000
Grant dateMay 7, 2002
Priority date
Expiry dateJun 5, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L1/246
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device is provided for measuring a bending load in mechanical constructions, which device enables measurement over a broad range of stresses with high precision and which simultaneously compensates for deviations caused by temperature fluctuations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.