Patent · US Expired

Modular test instrument

US6385300B1 · kind B1 · utility

36Cited by
42References
61Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 5, 2000
Grant dateMay 7, 2002
Priority date
Expiry dateMay 5, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04M1/24
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A modular test instrument comprises a base unit and one of a selection of application modules, neither being capable of performing end-user functions without the other. When physically assembled to one another, the base unit and application module comprise a structurally unitary device specialized for performance of application-specific end-user functions. The base unit is generic to all types of test to be provided, and comprises a display, a power supply, a user interface, and generic software to operate the display and user interface. Each application module is connected to the base unit in the same manner, so that the same base unit can be employed with a wide variety of application modules. The application modules can be readily and conveniently removed from and assembled to the base unit. The application-specific application modules each include a physical interface for establishing signal-communicating connection to the equipment to be tested, and application-specific program data and software including information required to provide appropriate test signals, test messages, and the like. Each application nodule also stores user interface software for providing an applicatio…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.