Double tilt and rotate specimen holder for a transmission electron microscope
US6388262B1 · kind B1 · utility
31Cited by
13References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 12, 1999 |
| Grant date | May 14, 2002 |
| Priority date | — |
| Expiry date | Aug 12, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2544
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A side-entry specimen holder for transmission electron microscopy is provided. The specimen holder is capable of rotating a specimen and tilting it in two axes. The specimen, when mounted in the holder, can be tilted in the plus/minus direction of the X-axis, the plus/minus direction of the Y-axis, and simultaneously have the ability of 360° rotation in the axis of the electron beam to permit alignment of microstructural features of the specimen for optimal viewing and analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.