Patent · US Expired

Insulative film for thin film structures

US6388378B1 · kind B1 · utility

11Cited by
4References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 1999
Grant dateMay 14, 2002
Priority date
Expiry dateJul 15, 2019

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC03C2218/365
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The present invention concerns an insulating film of a thin film structure deposited on an essentially alkali metal-free glass substrate, comprising alternating layers of aluminium oxide and titanium oxide and thin film electriluminescent device wherein said insulating film is incorporated as an insulating layer between the phosphor layer and the electrode layers. In the insulating film, the ratio between the cumulative thicknesses of said titanium oxide and said aluminium oxide is less than 0.75, and due to the ratio lower than that of prior art, good resistance against cracking of the film is obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.