Methods and apparatus for improved depth resolution use of out-of-focus information in microscopy
US6388809B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 26, 2000 |
| Grant date | May 14, 2002 |
| Priority date | — |
| Expiry date | Apr 26, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/06
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Apparatus and methods that improve the depth resolution of confocal microscopy images using out-of-focus information from within the focal plane of interest (from the x-y direction) and/or from planes above and below the focal plane of interest (from the z-direction). The interaction of (a) a reflective surface or other light-emanating material and (b) the PSF formed by a confocal microscope results in “out-of-focus” information in, above and below the focal plane; this “out-of-focus” information can be measured. Comparing the measurements in the x-y plane, preferably at a plurality of z-positions, can improve the resolution along each of the x, y, and z-axes, increase the number of the photons used in the system, thus improving the signal to noise ratio, and help correct for aberrations, such as spherical aberrations or other optical aberrations, in the optical system of a microscope.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.