Method for testing integrated circuit devices
US6392423B1 · kind B1 · utility
0Cited by
3References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2001 |
| Grant date | May 21, 2002 |
| Priority date | — |
| Expiry date | Mar 21, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.