Apparatus and method for remote ultrasonic determination of thin material properties using signal correlation
US6393384B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 1999 |
| Grant date | May 21, 2002 |
| Priority date | — |
| Expiry date | Apr 9, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an apparatus and method for remote ultrasonic determination of thin material properties using signal correlation, a method and apparatus are provided by which an arbitrarily-oriented anisotropic thin material may be interrogated for characterizing an unknown material property value thereof. The unknown material property may comprise for example temperature, pressure, elastic constants, density, hardness, composition, crystal orientation, grain size, and residual stress, or any material property that is variable with respect to known physical parameters of the material, for example known material elastic constants and/or density. In a first embodiment, theoretical signals are generated, for example a theoretical signal matrix, to characterize a material property value of a thin anisotropic material. A model of the thin material is generated comprising the behavior of the known material physical properties as functions of the unknown material property value to be characterized. For a plurality of known material thicknesses and known material property values, a transduction mechanism is simulated at a source location for generating a simulated elastic stress wave operating on the m…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.