Patent · US Expired

Method for fabricating a inductor of low parasitic resistance and capacitance

US6395637B1 · kind B1 · utility

50Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 1998
Grant dateMay 28, 2002
Priority date
Expiry dateOct 7, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method for fabricating an inductor and, more particularly, to a method for fabricating a spiral inductor used in a monolithic microwave integrated circuit on a silicon substrate using semiconductor fabrication processes. The method for fabricating an inductor, comprising the steps of: forming a first dielectric layer on a silicon substrate and forming a first metal wire on the first dielectric layer, wherein the first metal wire is in contact with an active element formed on the silicon substrate; and alternatively forming dielectric layers and metal layers, wherein the metal layers are electrically connected with an upper metal wire and a lower metal wire and wherein the metal layers are patterned using the dielectric layers as etching mask, whereby a metal corrosion is prevented by using the spiral dielectric pattern as the etching mask.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.