Power supply slew time testing of electronic circuits
US6396256B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 1998 |
| Grant date | May 28, 2002 |
| Priority date | — |
| Expiry date | Jun 30, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Power supply slew time testing is performed on units that require a power supply for operation. A power supply voltage is applied to a unit under test. The power supply voltage has a test slew time that is selected to evaluate operation of the unit under test in a system. A response of the unit under test to the power supply having the test slew time is observed, and the condition of the unit under test is determined based on the response to the power supply having the test slew time. The test may involve application of the power supply voltage having a maximum test slew time and application of the power supply voltage having a minimum test slew time. The test slew times are selected based on the expected range of power supply slew times when the unit is installed in a system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.