Scanning AC hall microscope
US6396261B1 · kind B1 · utility
5Cited by
0References
21Claims
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Key dates
| Filing date | Mar 20, 2000 |
| Grant date | May 28, 2002 |
| Priority date | — |
| Expiry date | Mar 20, 2020 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y25/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning AC hall microscope and a method which measures the domain pattern of magnetic materials, such as magnetic storage media, by measuring the oscillatory motion of a domain boundary under the influence of an external applied AC magnetic field, which allows a differentiation between domains which are immobile and domains which are mobile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.