Automated sample handling for X-ray crystallography
US6404849B1 · kind B1 · utility
34Cited by
5References
21Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 11, 1999 |
| Grant date | Jun 11, 2002 |
| Priority date | — |
| Expiry date | Aug 11, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.