Patent · US Expired

Electronic device parameter estimator and method therefor

US6405349B1 · kind B1 · utility

4Cited by
11References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 26, 2000
Grant dateJun 11, 2002
Priority date
Expiry dateMay 26, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A process (20) and design tool (62) are presented for the accurate prediction of design parameters (42) for components (38) of an integrated circuit (22) during the early stages of the design of that integrated circuit (22). These predicted design parameters (42) include pin count parameters (50), propagation delay parameters (52), layout area parameters (54), dynamic power parameters (56), static power parameters (58), and total power parameters (60). With these parameters, the designer interactively modifies the design prior to the layout and prototyping of the integrated circuit (22). The dynamic power parameters (56) and total power parameters (60) may be repetitively predicted with differing input items to establish a power usage pattern for the integrated circuit (22).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.