Automated system for testing two dimensional detector arrays and optical systems using sequential filters
US6407864B1 · kind B1 · utility
2Cited by
5References
17Claims
0Family size
Inventors
Key dates
| Filing date | Apr 14, 2000 |
| Grant date | Jun 18, 2002 |
| Priority date | — |
| Expiry date | Apr 14, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An automatic testing illumination system has advantages of speed, quick calibration ability and therefore high accuracy over conventional illuminators. An spherical light source/concentrator exit port is rapidly and sequentially covered by at least one automated device for affecting the light leaving the exit port. Automation enables a very rapid sequencing of light onto a two or three dimensional array to cut the time for test and evaluation, and to permit very accurate calibration of the illuminator system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.