Patent · US Expired

Multi-state nonvolatile semiconductor memory device which is capable of regularly maintaining a margin between threshold voltage distributions

US6411551B1 · kind B1 · utility

33Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2000
Grant dateJun 25, 2002
Priority date
Expiry dateOct 31, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5642
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A nonvolatile semiconductor memory device of the present invention has an array that includes a bit line, a plurality of word lines arranged perpendicularly to the bit line and a plurality of memory cells each arranged at intersections of the bit line and the word lines. In the nonvolatile semiconductor memory device is further provided a storage circuit and a program data judging circuit. The storage circuit has at least two latches each of which is connected to a corresponding input/output line and latches data. The program data judging circuit judges whether logic states of data latched in the latches indicate a programming or a program-inhibition of a selected memory cell, and sets the bit line to a program voltage or a program inhibition voltage according to a judgment result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.