Patent · US Expired

Integrated verification and manufacturability tool

US6415421B1 · kind B1 · utility

308Cited by
5References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 22, 2000
Grant dateJul 2, 2002
Priority date
Expiry dateDec 22, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated verification and manufacturability tool provides more efficient verification of integrated device designs than verification using several different verification tools. The integrated verification and manufacturability includes a hierarchical database to store shared design data accessed by multiple verification tool components (e.g., layout versus schematic, design rule check, optical process correction, phase shift mask assignment and machine language conversion). The hierarchical database includes representations of one or more additional, or intermediate layer structures that are created and used by the verification tool components for operations performed on the design being verified. Use of a single hierarchical database having shared data for access and use by multiple verification components streamlines the verification process, which provides an improved verification tool.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.