Securement of test points in a test head

US6417684B1 · kind B1 · utility

Assignee

• Feinmetall GmbH · DE

Inventors

• Rainer Schmid · Neckartenzlingen, DE
• Klaus Giringer · Herrenberg, DE
• Ulrich Gauss · Herrenberg, DE
• Heinz Deusch · Aidlingen, DE

Key dates

• Filing date: Oct 15, 1998
• Grant date: Jul 9, 2002
• Expiry date: Oct 15, 2018

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07357
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A test head for making contact with test points of an electric component under test and with contact points on a board, for example. A plurality of spring elastic, elongated electric contact elements have opposite ends which respectively contact a test point at one end and a contact point at the other end. A plurality of at least two and preferably three guide panels are located in the space between the test points and the contact points. A respective, first, second and third opening in the first, second and third panels for each of the contact elements for each of the contact elements, with two adjacent openings for each of the contact elements being laterally offset and misaligned so that the contact element passing through them is held in a friction locked fashion.