Wavelength measuring system
US6417926B1 · kind B1 · utility
2Cited by
3References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 21, 2000 |
| Grant date | Jul 9, 2002 |
| Priority date | — |
| Expiry date | Jan 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/0246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring the wavelength of light, particularly short pulses of light, with improved accuracy comprises passing the light down a backscatter medium such as an optical fiber and detecting and measuring the wavelength of the backscattered light which will have a pulse length of potentially far greater length than that of the initial pulse. The use of interferometers in conjunction with a reference light of known wavelength enables very accurate measurements to be made.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.