Patent · US Expired

Test fixtures for contacting assembled printed circuit boards

US6424163B1 · kind B1 · utility

9Cited by

2References

11Claims

0Family size

Assignee

Test Plus Electronic GmbH · DE

Inventor

Rainer Ott · Volkesfeld, DE

Key dates

Filing date	Feb 23, 2000
Grant date	Jul 23, 2002
Priority date	—
Expiry date	Feb 23, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/07328
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Test fixture for contacting assembled printed circuit boards 3 with a probe plate 1 for holding test probes 5, 19 arranged closely side by side (5, 19), with a first type of test probes 5 held from receptacles 4 inserted into the probe plate 1, into which contact elements 6, 7 are inserted from below towards the test probes 5, and with a smaller diameter second type of test probes 19, which are arranged without receptacles 4 in the probe plate 1 and which are shaped at their lower end as hollow probes for the reception of insertable contact elements 20, 25, the insertable 10 contact elements (20, 25) being fixed in additional assembly-plates 21, 22.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.