Patent · US Expired

Electrostatic apparatus for measurement of microfracture strength

US6424165B1 · kind B1 · utility

12Cited by
11References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 20, 2000
Grant dateJul 23, 2002
Priority date
Expiry dateSep 20, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0286
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A new class of materials testing apparatus has been invented. Particularly suited to the measurement of fracture and fatigue properties in the extremely strong materials encountered in microelectromechanical systems, material strains well in excess of 1% can be applied pseudostatically, dynamically, or repetitively by these testers. There are no other practical methods to determine these material properties routinely in a process environment, and few alternatives in any circumstances.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.