Patent · US Expired

Apparatus and method for determining return loss of an electrical device

US6424305B1 · kind B1 · utility

3Cited by
7References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 11, 2001
Grant dateJul 23, 2002
Priority date
Expiry dateApr 11, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B17/29
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A testing apparatus that comprises an electrical device. A first circuit is in electrical communication with the electrical device. The first circuit including an amplifier. First and second couplers are electrically connected to the first circuit and arranged in series with the amplifier. The amplifier is positioned between the first and second couplers. A second circuit has a first end in electrical communication with the first coupler and a second end in electrical communication with the second coupler. The total gain of the first coupler, the second coupler, the portion of the first circuit between the first and second couplers, and the second circuit is approximately zero.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.