Patent · US Expired

Magnetic head conductivity testing and form factor determination in a read/write device

US6424475B1 · kind B1 · utility

22Cited by
3References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 2000
Grant dateJul 23, 2002
Priority date
Expiry dateAug 16, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11B2220/20
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A preamplifier for a multi-head disk drive includes a circuit that tests the connectivity of each magnetic head in the disk drive by driving each head with a small current, and detecting the flow of this current. By driving and sensing the current flowing through the magnetic heads, both open-circuit faults and bridging faults can be detected. In a preferred embodiment, each head is tested sequentially. The result of each test is stored as a bit value in a register, for subsequent access. The circuit may be activated by a test device, or by a microcontroller in an assembled disk drive. To minimize costs, the circuit is integral to the circuitry that is conventionally used to read and write information via the magnetic heads. The oscillator that is conventionally used to characterize the read heads of a disk drive is used in a preferred embodiment to control the sequencing of tests through each head. A very low common mode voltage is provided during the testing of each write head, to minimize ESD (electro-static discharge) related problems. In a test mode, each write head is selected after a read head is selected, thereby minimizing the possibility of an accidental corruption of the…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.