Method and apparatus for mapping reflectance while illuminating volume data in a rendering pipeline
US6426749B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 1999 |
| Grant date | Jul 30, 2002 |
| Priority date | — |
| Expiry date | May 20, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Reflection intensities of volume samples of a volume are mapped in a rendering pipeline by determining a reflection vector from a gradient vector associated with a sample and an eye vector associated with the volume. A diffuse reflectance map is indexed by the gradient vector to obtain a diffuse intensity. A specular reflection map is indexed by the gradient vector to obtain a specular intensity in response to a bypass signal being true, and a specular reflection map is indexed by the reflection vector to obtain the specular intensity in response to the bypass signal being false.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.