Combination advanced corneal to topography/wave front aberration measurement
US6428168B2 · kind B2 · utility
11Cited by
16References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 21, 2001 |
| Grant date | Aug 6, 2002 |
| Priority date | — |
| Expiry date | May 21, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B3/107
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and apparatus for the simultaneous measurement of the anterior and posterior corneal surfaces, corneal thickness, and optical aberrations of the eye. The method employs direct measurements and ray tracing to provide a wide range of measurements for use by the ophthalmic community.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.