Specimen preview and inspection system
US6430309B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 1998 |
| Grant date | Aug 6, 2002 |
| Priority date | — |
| Expiry date | Mar 4, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S128/92
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specimen preview and inspection system is disclosed. The system beneficially includes a preview stage, which provides a set of biasing-information for preview by a technician before the technician formally screens the specimen. The preview stage enables the technician to conveniently review information pertinent to the specimen at issue. The preview stage may thereby bias, or channel, the technician's attention during screening toward diagnostically significant aspects of the specimen. The invention is particularly useful in the context of Pap smear screening, although the invention may extend to inspection of other types of specimens or samples as well.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.