Diagnostic procedures in an integrated circuit device
US6430727B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 19, 1997 |
| Grant date | Aug 6, 2002 |
| Priority date | — |
| Expiry date | Dec 19, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3648
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A single chip integrated circuit device includes a breakpoint range unit having first and second breakpoint registers for holding respectively lower and upper breakpoint addresses between which normal operation of the CPU is to be interrupted for diagnostic purposes. The breakpoint range unit further has comparison logic operative to compare the contents of the address register with each of a lower and upper breakpoint address, and to issue a breakpoint signal when the address held in an address register is equal to the lower breakpoint address or between the lower and upper breakup addresses. On chip control logic is connected to receive the breakpoint signal and arranged to interrupt normal operation of the CPU when the breakpoint signal is received. The comparison logic includes inverse state logic configured to set an inverse state indicator to cause generation of the breakpoint signal outside the address range defined by the upper and lower breakpoint address.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.