Patent · US Expired

Method and device for imaging with high geometrical resolution on a microsatellite

US6433815B1 · kind B1 · utility

1Cited by

2References

11Claims

0Family size

Assignee

DEUTSCHES ZENTRUM FÜR LUFT—UND RAUMFAHRT E.V. · DE

Inventors

Rainer Sandau · Stolzenhagen, DE
Klaus Briess · Berlin, DE
Martin Scheele · Brieselang, DE
Ingo Walter · Grundau, DE

Key dates

Filing date	Jun 28, 1999
Grant date	Aug 13, 2002
Priority date	—
Expiry date	Jun 28, 2019

Classification

Technology area (CPC H)Electricity
CPC primaryH04N25/41
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A method and a device for imaging with high geometrical resolution on a microsatellite. The device includes an objective and a focal plane on which an extended optical detector is fitted. The objective and the focal plane being fastened rigidly to the microsatellite. Intermediate optics, which can be moved using a setting and resetting instrument, are arranged between the objective and the focal plane.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.