Method of detecting systemic fault conditions in an intelligent electronic device
US6434715B1 · kind B1 · utility
86Cited by
12References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 14, 1999 |
| Grant date | Aug 13, 2002 |
| Priority date | — |
| Expiry date | Jun 14, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H3/044
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of detecting systemic fault conditions in an intelligent electronic device is presented. The intelligent electronic device includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device detects systemic fault conditions, i.e., root causes, as indicated by repeated, similar fault events.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.