Dual-axis static and dynamic force characterization device
US6434845B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 5, 2000 |
| Grant date | Aug 20, 2002 |
| Priority date | — |
| Expiry date | Oct 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/0016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A force characterization device utilizes a flexure having a compliant portion and a solid portion. During operation of a coordinate measuring machine (CMM) on the solid portion of the flexure, a first capacitance probe detects displacement of the solid portion of the flexure in a first dimension and a second capacitance probe detects displacement of the solid portion of the flexure in a second dimension perpendicular to the first dimension. The detected displacements in the first and second dimensions of the solid portion of the flexure are correlated to forces applied to the flexure in the first and second dimensions based on the detected displacements and the predetermined spring constant of the compliant portion of the flexure. A total applied force is determined based on the forces applied to the flexure in the first and second dimensions. The flexure may be utilized for touch-trigger operations or scanning operations of the CMM. For scanning operations, a normal force applied and a coefficient of friction between the contact probe of the CMM and the solid portion of the flexure may be determined from the total applied force and the forces applied in the first and second dimens…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.