Automatic probe identification system
US6437552B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2000 |
| Grant date | Aug 20, 2002 |
| Priority date | — |
| Expiry date | Jul 31, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/345
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The automatic probe identification system of the present invention automatically identifies an electrical test probe as being associated with a particular channel. Specifically, an automatic probe identification system of the present invention includes a testing instrument and at least one test probe. The testing instrument preferably has at least one input channel, each input channel being visually represented by a unique channel identification such as a colored trace. The test probe has a probe identifier such as a full-spectrum LED for selectively visually representing a unique probe channel identification. The probe identifier automatically visually represents a unique probe channel identification corresponding to the unique channel identification of the input channel to which it is coupled. An additional benefit of this system is that the probe identifier used in one preferred embodiment of the test probe provides additional illumination for shadowed or dark places.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.