Performing selected optical measurements with optical coherence domain reflectometry
US6437867B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2001 |
| Grant date | Aug 20, 2002 |
| Priority date | — |
| Expiry date | Jan 29, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/0084
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for performing selected optical measurements on a sample is provided utilizing an optical coherence domain reflectometer which includes a diffraction grating. A broad band light source produces light having a short coherence length. A beamsplitter splits the light into a signal beam and a reference beam. A reference mirror is disposed to receive the reference beam. A lens brings the signal beam to focus on the sample. A diffraction grating receives reflections from the sample and from the reference mirror, the reflections being incident on the diffraction grating with respect to said diffraction grating normal such that a positive diffraction order from one of the reflections and a negative diffraction order from the other one of the reflections and a negative diffraction order from the other one of the reflections propagate along a common path. A lens collects the diffracted order from the diffraction grating directed along the common path and brings the diffracted orders to focus on a detector, the detector producing an output of said positive and negative diffracted orders received. A computer processes the output from the detector. In other versions of the i…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.