Method for conducting sensor array-based rapid materials characterization
US6438497B1 · kind B1 · utility
35Cited by
90References
8Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 11, 1998 |
| Grant date | Aug 20, 2002 |
| Priority date | — |
| Expiry date | Dec 11, 2018 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC40B40/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing one or more material properties for each of five (5) or more samples, comprising the steps of depositing five or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of five or more samples and characterizes at least one material property of the sample supported thereby and measures at least one material property of the five or more samples at a rate of at least one sample every 2 minutes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.