Patent · US Expired

Method and apparatus for determining phase locked loop jitter

US6441602B1 · kind B1 · utility

10Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 2000
Grant dateAug 27, 2002
Priority date
Expiry dateOct 9, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L1/205
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An exemplary embodiment of the invention is a method for evaluating jitter of a phase locked loop circuit generating a phase locked loop output signal. The method includes generating a test initiate signal and generating a trigger signal in response to the test initiate signal. The trigger signal is synchronized with the phase locked loop output signal. A disturbance signal is generated to induce jitter in the phase locked loop output signal. The jitter in the phase locked loop output signal is then evaluated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.