Patent · US Expired

Set-up of measuring instruments for the parallel readout of SPR sensors

US6441906B2 · kind B2 · utility

7Cited by
3References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2001
Grant dateAug 27, 2002
Priority date
Expiry dateMay 18, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/553
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a set-up of measuring instruments for the parallel readout of SPR sensors. The aim of the invention is to provide a measuring arrangement for the parallel readout of a plurality of SPR sensors, wherein the readout process should be terminated within an integration period of less than 30 minutes. To this end, a wavelength-selective component (5) and an optical imaging system (L2, L3) are arranged downstream of a light source (3). Said optical imaging system (L2, L3) is in such a manner that at a first wavelength it guarantees a parallel illumination of the light entrance sides of the waveguides (13) which are provided with SPR-compatible sensor zones, and that the light emerging from the individual light waveguides (13) may simultaneously be imaged onto a CCD chip (20) via an optical system (L4) in such a way that the light emerging from each individual light waveguide (13) is respectively detectable by several adjacent CCD pixels of the CCD chip (20), and from these pixel areas a respective light intensity value is calculable by means of image processing software, and, after data storage of an intensity value, a set wave length and coordinate in the wavegui…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.