Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6442233B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 11, 2000 |
| Grant date | Aug 27, 2002 |
| Priority date | — |
| Expiry date | Aug 11, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for inspecting an enclosure. A beam of x-rays is used for scanning the enclosure and for identifying areas of suspect material. The beam is subsequently coherently scattered off suspect materials, during the course of a single pass of the enclosure past the beam, for uniquely discriminating innocuous from contraband substances. One or more energy dispersive detectors measure radiation coherently scattered by an identified volume of suspect material. Absorption effects of the energy distribution of the coherently scattered radiation are compensated by means of a fiducial reference disposed between the interrogated object and the detectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.