Devices for controlling temperature indications in integrated circuits using adjustable threshold temperatures
US6442500B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 22, 1999 |
| Grant date | Aug 27, 2002 |
| Priority date | — |
| Expiry date | Jul 22, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K3/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature condition indicator in a fabricated integrated circuit provides first and second voltage signals that vary with the temperature of the fabricated integrated circuit. The first voltage signal increases as the temperature of the fabricated integrated circuit increases and decreases as the temperature of the fabricated integrated circuit decreases. The second voltage signal decreases as the temperature of the fabricated integrated circuit increases and increases as the temperature of the fabricated integrated circuit decreases. The first and second voltage signals are about equal (or intersect) when the temperature of the fabricated integrated circuit is about equal to a first temperature. The first temperature is selected to correspond to a temperature out of range condition. The intersection of the first and second voltage signals may thereby indicate a threshold temperature for the operation of the fabricated integrated circuit. If a first temperature out of range condition occurs at about T degrees, the first and second voltage signals are controlled so that the intersection of the first and second voltage signals is about equal to a voltage level that corresponds to…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.