Diagnostic system with learning capabilities
US6442542B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 1999 |
| Grant date | Aug 27, 2002 |
| Priority date | — |
| Expiry date | Oct 8, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99945
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A diagnostic system is provided for identifying faults in a machine (e.g., CT scanner, MRI system, x-ray apparatus) by analyzing a data file generated thereby. The diagnostic system includes a trained database containing a plurality of trained data, each trained data associated with one of plurality of known fault types. Each trained data is represented by a trained set of feature values and corresponding weight values. Once a data file is generated by the machine, a current set of feature values are extracted from the data file by performing various analyses (e.g., time domain analysis, frequency domain analysis, wavelet analysis). The current set of feature values extracted is analyzed by a fault detector which produces a candidate set of faults based on the trained set of feature values and corresponding weight values for each of the fault types. The candidate set of faults produced by the fault detector is presented to a user along with a recommend repair procedure. In cases where no fault is identified or in response to a misdiagnosis produced by the diagnostic system, the user may interactively input a faulty condition associated with the machine being diagnosed (e.g., based …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.