Patent · US Expired

Flexible silicon strain gage

US6444487B1 · kind B1 · utility

25Cited by
30References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 1999
Grant dateSep 3, 2002
Priority date
Expiry dateFeb 5, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L9/0055
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A generally flexible strain gage comprising a strain sensing element, and a generally flexible substrate supporting the strain sensing element. The strain sensing element is made of single crystal or polycrystalline semiconducting material. The invention also includes a method for forming a generally flexible strain gage comprising the step of selecting a wafer having a portion of a base material and portion of a single crystal or polycrystalline semiconducting material located thereon. The method further comprises the steps of etching a strain sensing element out of the semiconducting material and forming a generally flexible substrate onto said sensing element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.