Optical scanning apparatus
US6445483B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 1997 |
| Grant date | Sep 3, 2002 |
| Priority date | — |
| Expiry date | Jul 1, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/125
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An improved optical scanning apparatus is adapted to be such that at either end of the scan range, an optical beam deflected by a reflecting surface of a scanner will pass through an anamorphic lens in scanning optics at a position spaced from its optical axis in the sub-scanning direction. The anamorphic lens has such a sectional profile in the sub-scanning direction that the lens thickness at one end of the sub-scanning direction differs from the thickness at the other end. Also, a high speed optical scanning apparatus based on the dual incidence and the oblique incidence, can prevent a positional variation of a scanning line that is due to a shift of each facet of the rotating polygonal mirror, which is caused by an offset of the rotating axis of the rotating polygonal mirror. The scanning apparatus includes a light source, a rotating polygonal mirror with a plural number of reflecting surfaces for reflecting and deflecting an optical beam emitted from the light source, transfer optics for receiving the optical beam that is reflected and deflected by a first reflecting surface of the rotating polygonal mirror and transferring the optical beam to a second reflecting surface of th…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.