Patent · US Expired

Semiconductor integrated circuit

US6445627B1 · kind B1 · utility

29Cited by
4References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJun 22, 2001
Grant dateSep 3, 2002
Priority date
Expiry dateJun 22, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/4402
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor integrated circuit can efficiently repair a defective bit in a memory and comprises a plurality of circuit blocks (RAM macro cells) each having an identification code coincidence detecting circuit for determining whether an input identification code coincides with a self identification code and a reception data latch and performing an operation according to latched data; a setting circuit capable of setting the identification code and information corresponding to the identification code and serially outputting the set information; and a control circuit capable of sequentially reading the set information from the setting circuit, converting the set information to parallel data, and transferring the parallel data to the plurality of circuit blocks. Each of the plurality of circuit blocks captures and holds the set information transferred when the identification code coincidence detecting circuit determines that the input identification code and the self identification code coincide.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.