Statistical process control integration systems and methods for monitoring manufacturing processes
US6445969B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 1998 |
| Grant date | Sep 3, 2002 |
| Priority date | — |
| Expiry date | Jan 9, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/53174
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.