Patent · US Expired

Method of producing impact point position probability maps for a well

US6446006B1 · kind B1 · utility

8Cited by
2References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 7, 2000
Grant dateSep 3, 2002
Priority date
Expiry dateOct 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V1/282
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method of producing impact point position probability maps for a well. It consists in defining a fixed, invariant target point chosen a priori on an initial location E0 of the surface S, discretizing the surface S with the aid of a grid composed of nodes and of grid cells, assigning at least one elementary geometrical uncertainty vector to each node of the grid of the surface S, determining a statistically significant number of occurrences of locations of the surface S as a function of the geometrical uncertainties affecting it, projecting the target point onto each occurrence of location of the surface so as to deduce a point of impact therefrom, transferring the set of impact points onto the location E0 of the surface S by allocating, to each of these points, surface co-ordinates identical to those which it had on the occurrence of location of the surface containing it.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.