Patent · US Expired

Multiple propagation wave parameter measuring method and apparatus and machine-readable recording medium recording multiple propagation wave parameter measuring program

US6446025B1 · kind B1 · utility

19Cited by
8References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 26, 1999
Grant dateSep 3, 2002
Priority date
Expiry dateMar 26, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S3/46
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a multiple propagation wave parameter measuring method, transmission waves are radiated into an outer space. The transmission waves are received as a multiple propagation wave. Arrival directions of the transmission waves are measured on the basis of reception signals. The transmission wave arriving from one direction of the measured arrival directions is defined as a desired wave, and the transmission waves arriving from remaining directions are defined as unnecessary waves. A weight with which a reception power ratio of the desired wave to the unnecessary waves becomes maximum is calculated. The reception signals are multiplied with the weight to extract the reception signal in which the unnecessary waves are suppressed. A change in delay time of the desired wave from a transmitting device to a receiving device is calculated on the basis of the reception signal in which the unnecessary waves are suppressed. A machine-readable recording medium storing a multiple propagation wave parameter measuring program is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.