Patent · US Expired

Method and apparatus for optimizing electronic design

US6446239B1 · kind B1 · utility

54Cited by
21References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 7, 1999
Grant dateSep 3, 2002
Priority date
Expiry dateJan 7, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/392
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system is disclosed for compacting an initial electronic layout of cells within an initial layout boundary. The system includes forming paths extending from a bottom edge of the layout to a top edge. The paths intersect cells of the initial layout. The system determines which of the paths are critical paths. Critical cuts are then determined. A critical cut is a cut that severs critical paths. A set of cells associated with a critical cut are removed from the layout and replaced in order to reduce the initial layout boundary.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.