Combined particle/vapor sampler
US6446514B1 · kind B1 · utility
34Cited by
13References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2000 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | Jan 18, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/2223
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An method of, and an apparatus for, collecting a sample of a substance of interest, utilizes an apparatus having a device for collecting a vapor sample and a device for retaining a substrate. A substrate, having a working portion and a mounting portion, is mounted by the mounting portion of the substrate, whereby the working portion of the substrate is exposed for use. The apparatus so that the working portion of the substrate traverses surfaces of interest, to collect a particulate sample. A device for sampling vapor is operated to obtain a vapor sample. The vapor and particulate samples collected are analyzed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.