Controlled particle deposition in drives and on media for thermal asperity studies
US6446517B1 · kind B1 · utility
3Cited by
111References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2000 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | Nov 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2005/001
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An environmental chamber that can be used to test a device under test such as a hard disk drive. The environmental chamber may include an electronically controlled shutter that controls the flow of controlled particles from a second chamber to a first chamber. The controlled particles flow to a device under the test located within the first chamber. The shutter can be closed when a predetermined threshold of contaminants is detected by the environmental chamber. This two-chamber method provides a stable and uniform density of particle environment around the drive.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.