Method and apparatus for particle assessment using multiple scanning beam reflectance
US6449042B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | May 4, 2000 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | May 4, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/4206
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a backscattering apparatus and method for optical scanning along a circular path using one or more optical illuminators and receivers. More particularly, it relates to an apparatus and method of focusing one or more beams of light into one or more beam spots, scanning the common beam spot(s) across a circular path and receiving light backscattered from the beam spot(s) with one or more detectors. A rotationally mounted scanning optics having an optical axis parallel to but not coaxial with the axis of rotation is used to accomplish these functions. A motor may be operatively linked to the scanning optics to cause the same to rotate at a constant angular velocity whereby, with appropriate signal generating detector and signal processing electronics, the number and size of particles suspended in a fluid medium exposed to the beam spot(s) can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.