Calibrated swept-wavelength laser and interrogator system for testing wavelength-division multiplexing system
US6449047B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 1999 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | Nov 12, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S3/0675
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source. The invention also provides methods for calibrating a swept-wavelength laser using the wavelength reference system provided herein as well as methods for detecting wavelengths in an optical signal or output using the interrogator systems provided herein. The invention fu…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.