Industrial inspection method and apparatus using dual energy x-ray attenuation
US6449334B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2000 |
| Grant date | Sep 10, 2002 |
| Priority date | — |
| Expiry date | Sep 30, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An industrial inspection device uses measurements at two x-ray energy to measure the relative proportions of two materials of a binary industrial composition by determining a mass ratio of a preselected selected first and second material expected to be in the binary composition and such as would provide a photoelectric absorption and Compton scattering consistent with the attenuation of the x-rays at the first and second energy. A relative proportion at different locations can be used to develop an image of one basis material. The image can be used to determine whether a product has an unacceptable composition or inclusions of foreign bodies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.