Patent · US Expired

Flexible test environment for automatic test equipment

US6449744B1 · kind B1 · utility

45Cited by
13References
43Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 10, 2000
Grant dateSep 10, 2002
Priority date—
Expiry dateJul 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31907
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A flexible test environment for automatic test equipment, whereby sequences of steps for developing and executing test programs are specified using hierarchical trees of nodes. The nodes in one tree include end leaves that correspond with the test program development steps, and the nodes in another tree include end leaves that correspond with the test program execution steps. Further, the end leaves in both trees have a plurality of associated properties, which are used for specifying test program flow and for indicating methods to be called when the steps are executed. The test environment can be easily adapted to a distributed tester architecture.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.