Patent · US Expired

Apparatus and method for measuring a dimension of a workpiece

US6449867B1 · kind B1 · utility

4Cited by
6References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 10, 2000
Grant dateSep 17, 2002
Priority date
Expiry dateMar 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B5/0004
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measuring a dimension of a workpiece includes a pair of rods positioned within a channel of a baseplate. At least one wedge member is mounted between the rods and forces the rods in a direction away from each other. A guide plate is adjustably mounted with respect to the baseplate, the guide plate having a cutout positioned at least partially over the rods for accepting the workpiece. A measuring tool is adjustably mounted with respect to the baseplate for moving in at least a linear direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.